People

Image of Jeramy D. Zimmerman

Jeramy D. Zimmerman

Assistant Professor, Physics and Materials Science

Education & Background

Awards and Honors

  • NSF IGERT Fellow (UCSB)
  • 2017 CASE Connector Award
  • 2017 DOE Early Career Research Program Awardee

My research interests are in developing and understanding materials used in various photovoltaic and light emitting devices. My on-campus research develops structure-property relationships connecting molecular properties, bulk morphology, interfacial morphology, and solid-film optoelectronic properties in small-molecule organic thin films. This research includes the use of atom probe tomography to understand fundamental science and improving device efficiency in small-molecule organic light emitting diodes and small-molecule organic photovoltaics. My other research interest, primarily with collaborators at NREL, is the integration of III-V materials with silicon for optoelectronic platforms such as photovoltaics.

Image of Andrew P. Proudian

Andrew P. Proudian

Postdoctoral Fellow

Education

Research Interests

  • Organic Electronics
  • Atom Probe Tomography
  • Structure-Property Relations
  • Microstructure and Morphology

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    Image of Matthew B. Jaskot

    Matthew B. Jaskot

    PhD Candidate, Materials Science

    Education & Background

    • BS, Mechanical Engineering, University of Delaware, 2008
    • Process Engineer at Sencera International (amorphous Si)
    • Development Engineer at Li-ion Motors (solar concentrators)
    • Mechanical Engineer at Encompass Machines (welding equipment)
    • Mechanical Engineer at Cavotec (US Navy’s Advanced Mooring System)

    Research Interests

    • Interface morphology of organic photovoltaics
    • Structure-property relationships in organic semiconductors
    • Aggregation and morphology effects on device properties in organic light emitting diodes

    My research interests revolve around using insights gained from Atom Probe Tomography (APT) to engineer more efficient, longer-lasting organic semiconductor devices. Using APT data as feedback on the structure of layers and interfaces in these devices, important design flaws can be identified and modified to better suit the device’s intent. For example, chemical degradation products can be identified and located spatially within a device to help understand the degradation process and how better design can help avoid or slow it. If dopants which are assumed to be well dispersed actually tend to aggregate, potential solutions to this problem can be tested in APT and correlated with device performance to determine how nanometer-scale structure and molecular distribution affects device properties.

    More Information

    Martin Ritter

    MS, Engineering Physics

    Development of a Ho skin patch

    Emily Makoutz

    MS, Materials Science

    Nanoimprint Lithography based low-cost patterning for III-V/Si integration for tandem photovoltaics

    Amanda Matheson

    BS, Engineering Physics

    Patterning via interference lithography

    Former Students

    Christelle Lyiza

    TGC Global LLC
    MS, Materials Science, 2015

    “Impact of Solid-State Chemical Reactions of Fullerene C60 on Small Molecule Organic Solar Cells”

    Abigail Meyer

    Cypress Semiconductor
    MS, Applied Physics, 2016

    “Concentration Quenching and Aggregation in Organic Light Emitting Diodes”

    Jesse DeMott

    Alarm.com
    BS, Computer Science, 2017

    “Modeling Electric Fields for Atom Probe Tomography of Organic Systems”

    Derek Fogel

    CREE, Inc.
    MS, Materials Science, 2017

    “Encapsulant Characterization and Doped Passivated Contacts for use in a Luminescent Solar Concentrator”